发明名称 マルチ荷電粒子ビーム描画装置及びマルチ荷電粒子ビーム描画方法
摘要 <p>In accordance with one aspect of this invention, a multi charged particle beam writing apparatus includes an aperture member, in which a plurality of openings are formed, configured to form multi-beams by making portions of the charged particle beam pass through the plurality of openings; a writing processing control unit configured to control writing processing so that a plurality of beams having passed through different openings among the plurality of openings are arranged to align on the target object; and a shot interval adjusting unit configured to adjust shot intervals among beams so that a maximum shot interval among beams being a control grid interval defined by a predetermined quantization size or a size which is prescribed within a predetermined range from the predetermined quantization size, or less when the shot intervals among beams which are arranged to align on the target object are different depending on a place.</p>
申请公布号 JP5826566(B2) 申请公布日期 2015.12.02
申请号 JP20110190958 申请日期 2011.09.01
申请人 株式会社ニューフレアテクノロジー 发明人 吉川 良一;小笠原 宗博
分类号 H01L21/027;G03F7/20;H01J37/305 主分类号 H01L21/027
代理机构 代理人
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