发明名称 半導体ウエーハ及び半導体素子及びその製造方法
摘要 <p><P>PROBLEM TO BE SOLVED: To provide a semiconductor wafer which has a little crack and excellent flatness, and to provide a semiconductor device and a method for manufacturing the semiconductor wafer and the semiconductor device. <P>SOLUTION: In the semiconductor wafer which includes a substrate 2, a buffer region 3 which is arranged on one main surface of the substrate 2 and is formed of a compound semiconductor, and a main semiconductor region 4 which is arranged on the buffer region 3 and is formed of the compound semiconductor, the buffer region 3 includes a first multilayer structure buffer region 5, and a second multilayer structure buffer region 8 arranged between the substrate and the first multilayer structure buffer region 5. <P>COPYRIGHT: (C)2012,JPO&INPIT</p>
申请公布号 JP5824814(B2) 申请公布日期 2015.12.02
申请号 JP20110010987 申请日期 2011.01.21
申请人 サンケン電気株式会社 发明人 柳原 将貴
分类号 H01L21/338;H01L21/20;H01L21/205;H01L29/778;H01L29/812 主分类号 H01L21/338
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