发明名称 シリコン化合物ガス中の不純物濃度の分析方法
摘要 <p><P>PROBLEM TO BE SOLVED: To provide an analytical method capable of stably analysing the concentration of siloxane which is an impurity in a silicon compound gas with high sensitivity compared to conventional analytical methods without requiring complex procedures and preparations. <P>SOLUTION: In a concentration analytical method for an impurity in a silicon compound gas, when the concentration of the impurity in the silicon compound gas having a Si-H bond in a molecular structure is analysed by using a gas chromatography-mass spectrometer (GC-MS), a separation column made by the combination of a packed column and a capillary column is used. <P>COPYRIGHT: (C)2013,JPO&INPIT</p>
申请公布号 JP5827843(B2) 申请公布日期 2015.12.02
申请号 JP20110198319 申请日期 2011.09.12
申请人 大陽日酸株式会社 发明人 高田 克則
分类号 G01N30/88;G01N27/62;G01N30/14;G01N30/32;G01N30/46;G01N30/72 主分类号 G01N30/88
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