发明名称 SHARED MASKS FOR X-LINES AND SHARED MASKS FOR Y-LINES FOR FABRICATION OF 3D MEMORY ARRAYS
摘要 A structure and a method of manufacturing a three dimensional memory using a number of bit line masks that is less than the number of device layers. A first bit line mask is used to form a first bit line layer in a first device level. The first bit line layer comprises first bit lines. The first bit line mask is also used to form a second bit line layer in a second device level. The second bit line layer comprises second bit lines. The first bit lines and the second bit lines have different electrical connections to a bit line connection level despite employing the same mask pattern.
申请公布号 EP2335284(B1) 申请公布日期 2015.12.02
申请号 EP20090792218 申请日期 2009.09.03
申请人 SANDISK 3D LLC 发明人 SCHEUERLEIN, ROY, E.
分类号 H01L27/02;H01L21/822;H01L27/06;H01L27/10 主分类号 H01L27/02
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