发明名称 High speed read access memory array with variation tolerant bypass scheme with protection circuit
摘要 A memory array for process variation tolerant bypass operation. The memory array may utilize normal read operation data path of a memory I/O module. Accordingly, the speed at which the bypass operation may be executed may be increased. Furthermore, a potential for false read operations introduced by the utilization of the normal read operation data path of the memory I/O module may be reduced using a protect mechanism operable to block the output of false reads from the memory array.
申请公布号 US9201595(B2) 申请公布日期 2015.12.01
申请号 US201213622896 申请日期 2012.09.19
申请人 Oracle International Corporation 发明人 Lee Jungyong;Li Singrong;Cho Hoyeol
分类号 G06F12/00;G06F3/06 主分类号 G06F12/00
代理机构 Marsh Fischmann & Breyfogle LLP 代理人 Marsh Fischmann & Breyfogle LLP
主权项 1. A method for process variation tolerant bypass operation of a memory array, comprising: receiving a memory command at the memory array corresponding to bypass operation of the memory array, wherein the memory command includes bypass data to be written to and read from a memory location of the memory array in a single clock cycle period of the memory array; writing, using a memory I/O module, the bypass data to a location in the memory array during the single clock cycle period; reading, using the memory I/O module, output data from the location in the memory array during the single clock cycle period; comparing the output data from the memory array during the single clock cycle period in relation to a bypass verification signal corresponding to an expected value of the output data of the single clock cycle period in view of the bypass data to determine whether the output data corresponds with the bypass data; and selectively passing the output data based on the comparing.
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