发明名称 Process for manufacturing of high surface area USP grade nano-anatase base
摘要 The present invention provides a novel manufacturing process for producing a high surface area USP grade titanium dioxide in the nano-anatase form. In a manufacturing method aspect of the present invention, a process of producing a high surface area USP grade TiO2 nano-anatase base is provided. The method involves steps of: a) phosphorus doping of the titanium hydrate obtained in hydrolysis of a titanium compound; b) drying and calcination of the doped paste, thereby producing a high surface area USP grade titanium dioxide in the anatase crystal form with nano-particles suitable for UV screens and cosmetics.
申请公布号 US9198843(B2) 申请公布日期 2015.12.01
申请号 US200912462821 申请日期 2009.08.11
申请人 发明人 Prochazka Jan R
分类号 A61K8/29;A61Q17/04;B82Y5/00;A61K8/02;C01G23/047;C01G23/053;C01G23/08 主分类号 A61K8/29
代理机构 代理人
主权项 1. A novel process for manufacturing a high surface area USP grade TiO2 nano-anatase base comprising the steps of: a) producing of a P-doped intermediate product by mixing together a clean titanium hydrate with a mineral acid containing phosphorus in the molecule as a phosphorus doping agent, wherein the introduced concentration of phosphorus is in the range from 0.1 to 0.5 weight percent on the TiO2 basis, and b) drying and calcination of the P-doped intermediate product, at the calcination temperature in the range from 650° C. to 850° C. and the time of calcination in the range from 1 to 24 hours, wherein the phosphorus concentration in the calcined product is between 0.1 and 0.5 weight percent based on TiO2 and the product of calcination is a high surface area TiO2 in nano-anatase crystal form meeting the USP grade quality wherein: i. loss on ignition at 800° C. for 2 hours is less than 1 weight percent, ii. specific surface area of the calcined product, determined from the nitrogen adsorption and desorption isotherms at 77 K (BET), is in the range from 20 to 75 m2/g, and iii. crystalline size determined from X-ray powder diffraction patterns (XRD) using the Scherrer equation is between 15 and 40 nm.
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