On-line memory testing systems and methods

摘要

A method for testing an electronic memory while the memory is in use includes: (a) detecting an access to the electronic memory at a test address, (b) saving, in a register subsystem, write data written to the electronic memory at a location corresponding to the test address, (c) comparing the write data to data read from the electronic memory at the location corresponding to the test address to determine whether the memory has a fault, and (d) generating an error signal if the memory has a fault.

主权项

1. A method for testing an electronic memory while the electronic memory is in use, comprising:
initializing a write error detection code in response to a write access to the electronic memory at a location at a beginning address of an address range under test; initializing a read error detection code in response to a read access to the electronic memory at the location at the beginning address of the address range under test; updating the write error detection code in response to each write access to the electronic memory at a location within the address range under test, such that a final value of the write error detection code is a cyclic redundancy check (CRC) value of data written to the electronic memory at each location within the address range under test; updating the read error detection code in response to each read access to the electronic memory at a location within the address range under test, such that a final value of the read error detection code is a CRC value of data read from the electronic memory at each location within the address range under test; comparing the final value of the write error detection code to the final value of the read error detection code to determine if the electronic memory has a fault; and generating an error signal if the electronic memory has a fault.