发明名称 |
Disk drive calibrating defect threshold based on statistical quality metric measured for reference tracks |
摘要 |
A disk drive is disclosed comprising a head actuated over a disk comprising a plurality of data tracks. First data is written to a first data track, and the first data is read from the first data track to measure a first quality metric representing a recording quality of the first data. Second data is written to a second data track, and the second data is read from the second data track to measure a second quality metric representing a recording quality of the second data. The first and second quality metrics are processed to generate a first statistical quality metric. A first defect threshold is generated based on the first statistical quality metric, and at least part of the disk is scanned for defects based on the first defect threshold. |
申请公布号 |
US9202517(B1) |
申请公布日期 |
2015.12.01 |
申请号 |
US201313762850 |
申请日期 |
2013.02.08 |
申请人 |
Western Digital Technologies, Inc. |
发明人 |
Barlow Carl E.;Patel Chirag C.;Fok Andrew W.;Tsai Chun Sei;Brunnett Donald |
分类号 |
G11B20/18 |
主分类号 |
G11B20/18 |
代理机构 |
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代理人 |
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主权项 |
1. A disk drive comprising:
a disk comprising a plurality of data tracks; a head; and control circuitry operable to:
write first data to a first data track;read the first data from the first data track and measure a first quality metric representing a recording quality of the first data;write second data to a second data track;read the second data from the second data track and measure a second quality metric representing a recording quality of the second data;process the first and second quality metrics to generate a first statistical quality metric comprising an average of the first and second quality metrics;generate a first defect threshold by adding a margin to the first statistical quality metric; andscan at least part of the disk for defects based on the first defect threshold. |
地址 |
Irvine CA US |