| 主权项 |
1. A method, comprising:
receiving EXTEST results that describe a plurality of IO (Input-Output) cells, with each IO cell having a driver and receiver, the plurality of IO cells including a first IO cell, a second IO cell, and a third IO cell with the first IO cell being adjacent to the second IO cell and the second IO cell being adjacent to the third IO cell, wherein the EXTEST is a signal that initiates a test mode from a IEEE™ 1149.1 boundary scan latch, an IO cell has a driver and a receiver using a chip-to-chip interconnect; identifying one or more spare IO cells from the plurality of IO cells, a spare IO cell allows a functional path to be routed through the spare IO cell without requiring any routing; determining whether there are more non-functional IOs than spare IO cells, wherein the driver does not transmit to the receiver via the chip-to-chip interconnect in a non-functional IO cell; marking, in response to there being a greater number of non-functional IO cells than spare IO cells, the plurality of IO cells as failing; determining that the second IO is a non-functional IO cell and the third IO is a spare IO cell in response to there being a greater number of spare IO cells than non-functional IO cells; determining whether the second IO cell can be routed through the third IO cell; routing, in response to determining that the second IO cell can be routed through the third IO cell, the second IO cell through the third IO cell using the IEEE™ 1149.1 boundary scan latch to select the second IO cell on a multiplexer on the third IO cell; determining, in response to determining that the second IO cell can not be routed through the third IO cell, whether the second IO cell can be routed through the first IO cell; and routing, in response to determining that the second IO cell can be routed through the first IO cell, the second IO cell through the first IO cell using the IEEE™ 1149.1 boundary scan latch to select the second IO cell on a multiplexer on the first IO cell. |
