| 摘要 |
A test chip includes a substrate, a lid member, a separation portion, a first flow path, and a first holding portion. The substrate includes a surface on which a flow path is formed. The lid member covers the surface of the substrate. By centrifugal force, the separation portion separates components of a test object liquid into a separated component and a residual component having a larger specific gravity than a specific gravity of the separated component. The first flow path guides the separated component from the separation portion to a receiving portion. The first holding portion holds at least part of the residual component overflowing from the separation portion in a case where the separated component separated in the separation portion is moved from the separation portion to the receiving portion. The first holding portion is connected to at least one of the separation portion and the first flow path. |
| 主权项 |
1. A test chip comprising:
a substrate including a surface on which a flow path is formed; a lid member configured to cover the surface of the substrate; a separation portion formed on the substrate and configured to separate components of a test object liquid into a separated component and a residual component by centrifugal force, the residual component having a larger specific gravity than a specific gravity of the separated component; a first flow path formed on the substrate and connecting the separation portion and a receiving portion, the first flow path being configured to guide the separated component from the separation portion to the receiving portion; a first holding portion formed on the substrate and connected to at least one of the separation portion and the first flow path, the first holding portion being configured to hold at least part of the residual component, the part of residual component overflowing from the separation portion in a case where the separated component separated in the separation portion is moved from the separation portion to the receiving portion via the first flow path; and a second flow path formed on the substrate and connecting a side wall, of the separation portion, on a side of the first flow path and the first holding portion, the second flow path being configured to guide the residual component from the separation portion to the first holding portion, the side wall extending in a direction between a first centrifugal force direction and a second centrifugal force direction, the first centrifugal force direction being a direction of the centrifugal force to be applied to the test chip when the test object liquid is introduced from a liquid accumulation portion to the separation portion and when, in the separation portion, the components of the test object liquid are separated into the separated component and the residual component, the liquid accumulation portion being formed on the substrate and positioned on an upstream side in the first centrifugal force direction with respect to the separation portion and being configured to accumulate the test object liquid, the second centrifugal force direction being a direction of the centrifugal force to be applied to the test chip when the separated component is moved from the separation portion to the receiving portion. |
