发明名称 SEMICONDUCTOR DEVICE HAVING PROTECTION PATTERN AND METHOD OF FORMING THE SAME
摘要 The present invention relates to a semiconductor device including a galvanic corrosion preventing pattern. A substrate with a keep out zone (KOZ) is arranged. A plurality of wires are formed out of the KOZ on the substrate. A through silicon via (TSV) is formed in the KOZ and passes through the substrate. Arranged is a protection pattern which is electrically insulated from the TSV, is formed in the KOZ, and has a conductive material which is different from the material of the TSV. The lower side of the protection pattern is formed on a level which is higher than the lower side of the TSV.
申请公布号 KR20150133520(A) 申请公布日期 2015.11.30
申请号 KR20140060402 申请日期 2014.05.20
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 KIM, EUN JI;CHO, SUNG DONG;MUN, HYOUNG YOL;PARK, YEONG LYEOL;LEE, SEUNG TAEK
分类号 H01L21/56;H01L21/28;H01L21/60;H01L21/768 主分类号 H01L21/56
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