发明名称 |
SEMICONDUCTOR DEVICE HAVING PROTECTION PATTERN AND METHOD OF FORMING THE SAME |
摘要 |
The present invention relates to a semiconductor device including a galvanic corrosion preventing pattern. A substrate with a keep out zone (KOZ) is arranged. A plurality of wires are formed out of the KOZ on the substrate. A through silicon via (TSV) is formed in the KOZ and passes through the substrate. Arranged is a protection pattern which is electrically insulated from the TSV, is formed in the KOZ, and has a conductive material which is different from the material of the TSV. The lower side of the protection pattern is formed on a level which is higher than the lower side of the TSV. |
申请公布号 |
KR20150133520(A) |
申请公布日期 |
2015.11.30 |
申请号 |
KR20140060402 |
申请日期 |
2014.05.20 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
KIM, EUN JI;CHO, SUNG DONG;MUN, HYOUNG YOL;PARK, YEONG LYEOL;LEE, SEUNG TAEK |
分类号 |
H01L21/56;H01L21/28;H01L21/60;H01L21/768 |
主分类号 |
H01L21/56 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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