| 摘要 |
<p>The invention relates to the field of testing methods, and specifically to a method for technical testing of a device, including at least one operational step corresponding to a stable value of at least one operational setting of the device and/or of a test bench for the device. Said operational step ends within a maximum duration threshold if a criterion associated with a set of physical parameters collected during the operational step is met and a level of confidence associated with said set of physical parameters reaches at least one predetermined threshold.</p> |
