发明名称 |
METHOD AND CONTROL DEVICE FOR LAUNCH-OFF-SHIFT AT-SPEED SCAN TESTING |
摘要 |
The invention provides a method for launch-off-shift at-speed scan testing for at least two scan chains of an integrated circuit comprises iteratively shifting set values for functional elements of a first one of the scan chains clocked with a shift clock, iteratively shifting set values for functional elements of a second one of the scan chains clocked with the shift clock, launching an at-speed scan test clocked with a functional clock for the first one of the scan chains at a last shift cycle of the first one of the scan chains, delaying the last shift cycle for the second one of the scan chains for a predetermined time span, launching an at-speed scan test clocked with a functional clock for the second one of the scan chains at the last shift cycle of the second one of the scan chains, capturing the sample values of the functional elements of the first and second scan chains after the last shift cycle of the scan chains. |
申请公布号 |
US2015338460(A1) |
申请公布日期 |
2015.11.26 |
申请号 |
US201314758969 |
申请日期 |
2013.01.08 |
申请人 |
SOFER Sergey;BERKOVITZ Asher;PRIEL Michael |
发明人 |
SOFER Sergey;BERKOVITZ Asher;PRIEL Michael |
分类号 |
G01R31/3177;G01R31/317 |
主分类号 |
G01R31/3177 |
代理机构 |
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代理人 |
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主权项 |
1. A method for launch-off-shift at-speed scan testing for at least two scan chains of an integrated circuit, comprising:
iteratively shifting set values for functional elements of a first one of the scan chains clocked with a shift clock; iteratively shifting set values for functional elements of a second one of the scan chains clocked with the shift clock; launching an at-speed scan test clocked with a functional clock for the first one of the scan chains at a last shift cycle of the first one of the scan chains; delaying the last shift cycle for the second one of the scan chains for a predetermined time span; launching an at-speed scan test clocked with the functional clock for the second one of the scan chains at the last shift cycle of the second one of the scan chains; capturing the sample values of the functional elements of the first one of the scan chains after the last shift cycle of the first one of the scan chains; and capturing the sample values of the functional elements of the second one of the scan chains after the last shift cycle of the second one of the scan chains. |
地址 |
Rishon Lezion IL |