发明名称 |
CONTROL OF P-CONTACT RESISTANCE IN A SEMICONDUCTOR LIGHT EMITTING DEVICE |
摘要 |
A device according to embodiments of the invention includes a semiconductor device structure (10) including a light emitting region (14) disposed between an n-type semiconductor region (16) and a p-type semiconductor region (12). A surface of the p-type semiconductor region (12) perpendicular to a growth direction of the semiconductor device structure (10) includes a first portion and a second portion. The first portion is less conductive than the second portion. The device further includes a p-contact (21) disposed on the p-type semiconductor region (12) and an n-contact (26) disposed on the n-type semiconductor region (16). The p-contact (21) includes a contact metal layer (20) and a blocking material layer (24). The blocking material layer (24) is disposed over the first portion and no blocking material layer (24) is disposed over the second portion. |
申请公布号 |
US2015340563(A1) |
申请公布日期 |
2015.11.26 |
申请号 |
US201414762023 |
申请日期 |
2014.01.15 |
申请人 |
Koninklijke Philips N.V. |
发明人 |
CHOY Kwong-Hin Henry |
分类号 |
H01L33/40;H01L33/22;H01L33/20;H01L33/00;H01L33/14 |
主分类号 |
H01L33/40 |
代理机构 |
|
代理人 |
|
主权项 |
1. A device comprising:
a semiconductor structure comprising a light emitting layer disposed between an n-type region and a p-type region, wherein a surface of the p-type region comprises a first portion and a second portion, wherein the surface is perpendicular to a growth direction of the semiconductor structure, wherein the first portion is less conductive than the second portion; and a p-contact formed on the p-type region, the p-contact comprising: a reflector; and a blocking material, wherein the blocking material is disposed over the first portion and no blocking material is disposed over the second portion. |
地址 |
Eindhoven NL |