发明名称 CONTROL OF P-CONTACT RESISTANCE IN A SEMICONDUCTOR LIGHT EMITTING DEVICE
摘要 A device according to embodiments of the invention includes a semiconductor device structure (10) including a light emitting region (14) disposed between an n-type semiconductor region (16) and a p-type semiconductor region (12). A surface of the p-type semiconductor region (12) perpendicular to a growth direction of the semiconductor device structure (10) includes a first portion and a second portion. The first portion is less conductive than the second portion. The device further includes a p-contact (21) disposed on the p-type semiconductor region (12) and an n-contact (26) disposed on the n-type semiconductor region (16). The p-contact (21) includes a contact metal layer (20) and a blocking material layer (24). The blocking material layer (24) is disposed over the first portion and no blocking material layer (24) is disposed over the second portion.
申请公布号 US2015340563(A1) 申请公布日期 2015.11.26
申请号 US201414762023 申请日期 2014.01.15
申请人 Koninklijke Philips N.V. 发明人 CHOY Kwong-Hin Henry
分类号 H01L33/40;H01L33/22;H01L33/20;H01L33/00;H01L33/14 主分类号 H01L33/40
代理机构 代理人
主权项 1. A device comprising: a semiconductor structure comprising a light emitting layer disposed between an n-type region and a p-type region, wherein a surface of the p-type region comprises a first portion and a second portion, wherein the surface is perpendicular to a growth direction of the semiconductor structure, wherein the first portion is less conductive than the second portion; and a p-contact formed on the p-type region, the p-contact comprising: a reflector; and a blocking material, wherein the blocking material is disposed over the first portion and no blocking material is disposed over the second portion.
地址 Eindhoven NL