发明名称 |
SEMICONDUCTOR DEVICE |
摘要 |
PROBLEM TO BE SOLVED: To provide a highly reliable transistor and a semiconductor device using the transistor.SOLUTION: A semiconductor device includes: a gate electrode; a gate insulating film on the gate electrode; an oxide semiconductor film on the gate insulating film; and a source electrode and a drain electrode on the oxide semiconductor film. In the semiconductor device, activation energy of the oxide semiconductor film obtained from temperature dependence of current (on current) flowing between the source electrode and the drain electrode when voltage greater than or equal to threshold voltage is applied to the gate electrode is 0 meV or more and 25 meV or less. |
申请公布号 |
JP2015213178(A) |
申请公布日期 |
2015.11.26 |
申请号 |
JP20150120789 |
申请日期 |
2015.06.16 |
申请人 |
SEMICONDUCTOR ENERGY LAB CO LTD |
发明人 |
YAMAZAKI SHUNPEI;TSUJI TAKAHIRO;OCHIAI TERUAKI;KUSUNOKI KOJI;MIYAIRI HIDEKAZU |
分类号 |
H01L29/786;G02F1/1368;H01L51/50;H05B33/14 |
主分类号 |
H01L29/786 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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