发明名称 |
METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE AND SEMICONDUCTOR DEVICE |
摘要 |
A method for manufacturing a semiconductor device includes forming two isolation structures in a substrate to define a fin structure between the two isolation structures in the substrate. A dummy gate and spacers are formed bridging the two isolation structures and over the fin structure. The two isolation structures are etched with the dummy gate and the spacers as a mask to form a plurality of slopes under the spacers in the two isolation structures. A gate etch stop layer is formed overlying the plurality of slopes. The dummy gate and the two isolation structures beneath the dummy gate are removed to create a cavity confined by the spacers and the gate etch stop layer. A gate is then formed in the cavity. |
申请公布号 |
US2015340475(A1) |
申请公布日期 |
2015.11.26 |
申请号 |
US201514819654 |
申请日期 |
2015.08.06 |
申请人 |
TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD. |
发明人 |
LIN Chien-Chih;HONG Long-Jie;WANG Chih-Lin;CHANG Chia-Der |
分类号 |
H01L29/66;H01L29/06;H01L21/3105;H01L21/311 |
主分类号 |
H01L29/66 |
代理机构 |
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代理人 |
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主权项 |
1. A method for manufacturing a semiconductor device, the method comprising:
forming two isolation structures in a substrate to define a fin structure between the two isolation structures in the substrate; forming a dummy gate and spacers bridging the two isolation structures and over the fin structure; etching the two isolation structures with the dummy gate and the spacers as a mask to form a plurality of slopes under the spacers in the two isolation structures; forming a gate etch stop layer overlying the plurality of slopes; removing the dummy gate and the two isolation structures beneath the dummy gate to create a cavity confined by the spacers and the gate etch stop layer; and forming a gate in the cavity. |
地址 |
HSINCHU TW |