发明名称 |
PIEZOELECTRIC THIN FILM, AND PIEZOELECTRIC THIN FILM ELEMENT |
摘要 |
Provided is a piezoelectric thin film having piezoelectric properties which do not readily deteriorate. The piezoelectric thin film (3) includes: a potassium sodium niobate represented by general formula (1), namely (K1-xNax)NbO3; and CaTiO3. In the X-ray diffraction profile of the piezoelectric thin film (3), the lattice plane spacing calculated from the diffraction peak of the (001) plane is not more than 3.975Å. Furthermore, in the X-ray diffraction profile of the piezoelectric thin film (3), the ratio (I101/I001) of the diffraction peak intensity (I101) of the (101) plane to the diffraction peak intensity (I001) of the (001) plane satisfies log10(I101/I001)≤-2.10. |
申请公布号 |
WO2015178196(A1) |
申请公布日期 |
2015.11.26 |
申请号 |
WO2015JP63119 |
申请日期 |
2015.05.01 |
申请人 |
MURATA MANUFACTURING CO., LTD. |
发明人 |
IKEUCHI, SHINSUKE;YONEDA, TOSHIMARO;MATSUKI, YOSHITAKA;ENDO, NAOYUKI |
分类号 |
H01L41/187;C01G23/00;C01G33/00;C23C14/08 |
主分类号 |
H01L41/187 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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