发明名称 Method of Forming Multiple Patterning Spacer Structures
摘要 Disclosed herein is a method of forming a structure, comprising forming a mandrel layer over a substrate, masking the mandrel layer with a first mask and performing a first etch on the mandrel layer, the first etch forming a first opening exposing a first portion of the substrate. The mandrel layer is masked with a second mask and a second etch is performed on the mandrel layer. The second etch forms a second opening exposing a second portion of the substrate, and also forms a protective layer on the first portion of the substrate and in the first opening.
申请公布号 US2015340239(A1) 申请公布日期 2015.11.26
申请号 US201514816946 申请日期 2015.08.03
申请人 Taiwan Semiconductor Manufacturing Company, Ltd. 发明人 Lu Chih Wei;Lee Chung-Ju;Shue Shau-Lin
分类号 H01L21/308 主分类号 H01L21/308
代理机构 代理人
主权项 1. A method comprising: depositing a mandrel layer on a substrate; forming a first patterned mask layer on the mandrel layer; etching a first opening in the mandrel layer, using the first patterned mask layer as an etch mask, the first opening exposing a portion of the substrate; removing the first patterned mask layer; forming a second patterned mask layer on the mandrel layer; etching a second opening in the mandrel layer using the second patterned mask layer as an etch mask and simultaneously forming a protective layer on the exposed portion of the substrate; and removing the second patterned mask layer.
地址 Hsin-Chu TW
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