发明名称 PRISM-COUPLING SYSTEMS AND METHODS FOR CHARACTERIZING LARGE DEPTH-OF-LAYER WAVEGUIDES
摘要 <p>Prism-coupling systems and methods for characterizing large depth- of-layer waveguides are disclosed. The systems and methods utilize a coupling prism having a prism angle a, which is defined by the coupling surface and the output surface and is in the range 0.81α max <α<0.99α max where the maximum coupling angle αmax is given by the prism angle at which total internal reflection occurs. This configuration causes the more spaced-apart lower-order mode lines to move closer together and the more tightly spaced higher-order mode lines to separate. The adjusted mode-line spacing allows for proper sampling at the detector of the otherwise tightly spaced mode lines. The mode-line spacings of the detected mode spectra are then corrected via post-processing. The corrected mode spectra are then processed to obtain at least one characteristic of the waveguide.</p>
申请公布号 WO2015179487(A1) 申请公布日期 2015.11.26
申请号 WO2015US31722 申请日期 2015.05.20
申请人 CORNING INCORPORATED 发明人 LI, SHENPING;ROUSSEV, ROSTISLAV VATCHEV
分类号 G01N21/41;G01J4/04;G01N21/84 主分类号 G01N21/41
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