发明名称 METHODS OF REMOVING FINS FOR FINFET SEMICONDUCTOR DEVICES
摘要 One illustrative method disclosed herein includes forming a plurality of initial fins in a substrate, wherein at least one of the initial fins is a to-be-removed fin, forming a material adjacent the initial fins, forming a fin removal masking layer above the plurality of initial fins, removing a desired portion of the at least one to-be-removed fin by: (a) performing a recess etching process on the material to remove a portion, but not all, of the material positioned adjacent the sidewalls of the at least one to-be-removed fin, (b) after performing the recess etching process, performing a fin recess etching process to remove a portion, but not all, of the at least one to be removed fin and (c) repeating steps (a) and (b) until the desired amount of the at least one to-be-removed fin is removed.
申请公布号 US2015340238(A1) 申请公布日期 2015.11.26
申请号 US201514811987 申请日期 2015.07.29
申请人 GLOBALFOUNDRIES Inc. 发明人 Xie Ruilong;Knorr Andreas;Jacob Ajey Poovannummoottil;Hargrove Michael
分类号 H01L21/308;H01L21/8234 主分类号 H01L21/308
代理机构 代理人
主权项
地址 Grand Cayman KY