MEASUREMENT SYSTEM, METHOD FOR MEASUREMENT

摘要

A measurement system includes an irradiator, an image capturer, and an arithmetic processor. The irradiator irradiates a first irradiation line with a laser beam at a first irradiation angle, and irradiates second irradiation lines with the laser beam respectively at second irradiation angles. The second irradiation lines intersect the first irradiation line. The image capturer acquires a two-dimensional image of an area including the first irradiation line and the second irradiation lines. The arithmetic processor calculates the second irradiation angles based on the first irradiation angle, based on a first position, in the two-dimensional image, of a first point on the first irradiation line, and based on second positions, in the two-dimensional image, of second points of the second irradiation lines, and calculates three-dimensional coordinates of the second points based on the second irradiation angles and the second positions.

主权项

1. A measurement system comprising:
an irradiator configured to irradiate a first irradiation line with a laser beam at a predetermined first irradiation angle, and configured to irradiate a plurality of second irradiation lines with the laser beam respectively at a plurality of second irradiation angles, the plurality of second irradiation lines intersecting the predetermined first irradiation line; an image capturer configured to acquire a two-dimensional image of an area comprising the predetermined first irradiation line and the plurality of second irradiation lines; and an arithmetic processor configured to calculate the plurality of second irradiation angles based on the first irradiation angle, based on a first position, in the two-dimensional image, of a first point on the predetermined first irradiation line, and based on second positions, in the two-dimensional image, of second points of the plurality of second irradiation lines, and configured to calculate three-dimensional coordinates of the second points based on the plurality of second irradiation angles and based on the second positions.