发明名称 |
TOP-LAYER MEMBRANE FORMATION COMPOSITION AND METHOD FOR FORMING RESIST PATTERN USING SAME |
摘要 |
[Problem] To provide: a top-layer membrane formation composition able to form a pattern having superior pattern shape and roughness in a method for forming a pattern by means of extremely ultraviolet ray exposure; and a method for forming a pattern using same. [Solution] The top-layer membrane formation composition is characterized by comprising an aqueous solvent and an aromatic compound having an aromatic hydroxyl group. The method forms a pattern by means of applying the composition on a resist surface and exposing/developing the result. The composition may further include a binder. |
申请公布号 |
WO2015178387(A1) |
申请公布日期 |
2015.11.26 |
申请号 |
WO2015JP64362 |
申请日期 |
2015.05.19 |
申请人 |
AZ ELECTRONIC MATERIALS (LUXEMBOURG) S. A. R. I. |
发明人 |
SUZUKI MASATO;WANG XIAOWEI;OKAYASU TETSUO;HAMA YUSUKE;PAWLOWSKI GEORG |
分类号 |
G03F7/11;H01L21/027 |
主分类号 |
G03F7/11 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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