发明名称 TOP-LAYER MEMBRANE FORMATION COMPOSITION AND METHOD FOR FORMING RESIST PATTERN USING SAME
摘要 [Problem] To provide: a top-layer membrane formation composition able to form a pattern having superior pattern shape and roughness in a method for forming a pattern by means of extremely ultraviolet ray exposure; and a method for forming a pattern using same. [Solution] The top-layer membrane formation composition is characterized by comprising an aqueous solvent and an aromatic compound having an aromatic hydroxyl group. The method forms a pattern by means of applying the composition on a resist surface and exposing/developing the result. The composition may further include a binder.
申请公布号 WO2015178387(A1) 申请公布日期 2015.11.26
申请号 WO2015JP64362 申请日期 2015.05.19
申请人 AZ ELECTRONIC MATERIALS (LUXEMBOURG) S. A. R. I. 发明人 SUZUKI MASATO;WANG XIAOWEI;OKAYASU TETSUO;HAMA YUSUKE;PAWLOWSKI GEORG
分类号 G03F7/11;H01L21/027 主分类号 G03F7/11
代理机构 代理人
主权项
地址