发明名称 SUBSTRATE UNIT, LIQUID CRYSTAL DISPLAY UNIT, AND ELECTRONIC APPARATUS
摘要 A substrate unit includes a first substrate, a second substrate, an adhesive layer in which conductive particles and an adhesive agent are mixed, and an inspection pattern. In the inspection pattern, one of a first inspection electrode and a second inspection electrode includes a plurality of bar electrodes arranged to extend in a first direction and a connection electrode that connects the bar electrode to the other adjacent bar electrode. The first inspection electrode is conducted with the second inspection electrode at a first portion that includes at least one of the bar electrodes, the first inspection electrode is conducted with the second inspection electrode at a second portion that is different from the first portion and includes at least one of the bar electrodes, and the first portion and the second portion are arranged at positions not overlapped with each other along the first direction.
申请公布号 US2015342033(A1) 申请公布日期 2015.11.26
申请号 US201514718873 申请日期 2015.05.21
申请人 Japan Display Inc. 发明人 HASEGAWA Kazuya
分类号 H05K1/02;G02F1/13;H05K1/03 主分类号 H05K1/02
代理机构 代理人
主权项 1. A substrate unit comprising: a first substrate provided with first wiring; a second substrate provided with second wiring on a flexible substrate body; an adhesive layer in which conductive particles and an adhesive agent are mixed to conduct the first wiring of the first substrate with the second wiring of the second substrate; and an inspection pattern including a first inspection electrode formed in a region of the first substrate in which the adhesive layer is arranged and a second inspection electrode formed in a region of the second substrate facing the first inspection electrode and conducted with the first inspection electrode via the adhesive layer, wherein in the inspection pattern, one of the first inspection electrode and the second inspection electrode includes a connection electrode that connects a plurality of adjacent bar electrodes arranged to extend in a first direction to each other, the first inspection electrode is conducted with the second inspection electrode at a first portion that includes at least one of the bar electrodes, the first inspection electrode is conducted with the second inspection electrode at a second portion that is different from the first portion and includes at least one of the bar electrodes, and the first portion and the second portion are arranged at positions not overlapped with each other along the first direction, and electric current does not flow when one of the first portion and the second portion is not conducted.
地址 Tokyo JP