发明名称 MAGNETIC FIELD MEASUREMENT DEVICE, MAGNETIC FIELD MEASUREMENT SYSTEM, AND MAGNETIC FIELD MEASUREMENT METHOD
摘要 PROBLEM TO BE SOLVED: To measure magnetic fields of objects to be measured without being influenced by disturbance exceeding a range that a measurement part which irradiates gas cells to measure their magnetic fields can measure even when there is the disturbance to the measurement part.SOLUTION: A magnetic field measurement device includes: a first gas cell 10 arranged in the +z direction viewed from an object 50 to be measured; a second gas cell 20 arranged in the +z direction viewed from the first gas cell 10; a first measurement part 11 which emits light to measure a component in the +z direction of a magnetic field in the first gas cell 10; a second measurement part 21 which emits light to measure a component in the +z direction of a magnetic field in the second gas cell 20; magnetic field generation means (coils 31, 32) for sandwiching the object 50 to be measured, the first gas cell 10, the second gas cell 20 along the +z direction to generate a magnetic field toward the second gas cell 20 so that the component measured by the second measurement part 21 becomes small; and an output part 40 which outputs a signal according to difference in the components measured by the first measurement part 11 and the second measurement part 21, respectively.
申请公布号 JP2015212715(A) 申请公布日期 2015.11.26
申请号 JP20150167070 申请日期 2015.08.26
申请人 SEIKO EPSON CORP 发明人 HOKARI RYUJI
分类号 G01R33/26 主分类号 G01R33/26
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