发明名称 MANUFACTURING METHOD OF FUNCTIONAL DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a manufacturing method of a functional element capable of suppressing a defect such as a defective shape in the functional element.SOLUTION: A manufacturing method of a functional element includes: a seed layer formation step of forming a seed layer 20 on a substrate 10; a mask layer formation step of forming a mask layer 40 having opening portions 41 on the seed layer 20; an oxide film formation step of forming oxide films 50 obtained by applying oxidation treatment of the mask layer 40 with a film thickness of surface roughness of the mask layer 40 within a range of Ra to 100 nm at least at a part of an exposed surface of the mask layer 40; a seed layer etching step of performing etching of the seed layer 20 subsequent to formation of the oxide film 50; and a substrate etching step of performing etching of the substrate 10 subsequent to the etching of the seed layer 20.
申请公布号 JP2015213208(A) 申请公布日期 2015.11.26
申请号 JP20140094452 申请日期 2014.05.01
申请人 SEIKO EPSON CORP 发明人 NAKAGAWA NAOHIRO
分类号 H03H3/02;B81C1/00;G01C19/5628;H01L21/308;H03H9/19;H03H9/215 主分类号 H03H3/02
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