发明名称 基板処理装置、基板処理方法および半導体装置の製造方法
摘要 <p>PROBLEM TO BE SOLVED: To improve substrate processing productivity by reducing the cost of substrate processing which uses plasma.SOLUTION: A substrate processing device comprises: a processing chamber which processes a substrate; a first plasma generating chamber provided in the processing chamber; first reactive gas supply means for supplying a first reactive gas into the first plasma generating chamber; a pair of first discharge electrodes which generates plasma in the first plasma generating chamber and generates an active species of the first reactive gas by exciting the first reactive gas; a first gas port which is provided on a sidewall of the first plasma generating chamber and jets the active specifies of the first reactive gas to the substrate; a second plasma generating chamber provided in the processing chamber; second reactive gas supply means for supplying a second reactive gas into the second plasma generating chamber; a pair of second discharge electrodes which generates plasma in the second plasma generating chamber and generates an active species of the second reactive gas by exciting the second reactive gas; and a second gas port which is provided on a sidewall of the second plasma generating chamber and jets the active specifies of the second reactive gas to the substrate.</p>
申请公布号 JP5824544(B2) 申请公布日期 2015.11.25
申请号 JP20140035189 申请日期 2014.02.26
申请人 发明人
分类号 H01L21/31;C23C16/452;C23C16/50;C23C16/52;H01L21/318 主分类号 H01L21/31
代理机构 代理人
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