发明名称 PHOTORESIST AND METHOD
摘要 Provided in the present invention is a photoresist having a degradable group coupled with a high etching resistance moiety. Alternatively, the degradable group is additionally attached to a reattachment group reattached to a polymer after the degradable group is cleaved from the polymer. The photoresist further comprises a non-leaving monomer having a crosslinking part and a crosslinking agent.
申请公布号 KR20150131940(A) 申请公布日期 2015.11.25
申请号 KR20150018589 申请日期 2015.02.06
申请人 TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD. 发明人 WU CHEN HAU;LAI WEI HAN;CHANG CHING YU
分类号 G03F7/038 主分类号 G03F7/038
代理机构 代理人
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