发明名称 |
FRONT FACE PROTECTION ADHESIVE TAPE FOR REAR FACE GRINDING FOR SEMICONDUCTOR WAFER, AND GRINDING METHOD OF SEMICONDUCTOR WAFER |
摘要 |
PROBLEM TO BE SOLVED: To provide a front face protection adhesive tape for rear face grinding for semiconductor wafer which improves workability by providing both visibility in sticking and heat resistance without generating a sensor recognition problem even if applied to a semiconductor wafer that thin film grinding is required in a rear face grinding step for a silicon wafer or the like, and a grinding method of the semiconductor wafer.SOLUTION: The front face protection adhesive tape for rear face grinding for the semiconductor wafer is formed by providing a base material 1 and an adhesive layer 2 on one side of the base material. Surface roughness on the side of the base material where the adhesive layer is not formed is Rz=0.7 to 5.0 μm. Full light transmittance in a wavelength 500 to 600 nm of the front face protection adhesive tape for rear face grinding for the semiconductor wafer is 40 to 80%. A difference between a color difference (&Dgr;EM) of a mirror wafer and a color difference (&Dgr;ET) in the state where the front face protection adhesive tape for rear face grinding for the semiconductor wafer is stuck to the mirror wafer is &Dgr;ET-&Dgr;EM>6.5. |
申请公布号 |
JP2015211172(A) |
申请公布日期 |
2015.11.24 |
申请号 |
JP20140093059 |
申请日期 |
2014.04.28 |
申请人 |
FURUKAWA ELECTRIC CO LTD:THE |
发明人 |
YOKOI HIROTOKI |
分类号 |
H01L21/304;B32B27/00;C09J7/02;C09J201/00 |
主分类号 |
H01L21/304 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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