发明名称 NITRIDE SEMICONDUCTOR ELEMENT AND MANUFACTURING METHOD OF THE SAME
摘要 PROBLEM TO BE SOLVED: To provide a nitride semiconductor element and a manufacturing method of the same, which can promote adequate growth from a c-plane of a sapphire substrate to achieve stable and good quality crystallinity by more successfully inhibiting crystal growth of a GaN-based nitride semiconductor from an inclined plane of a salient on the sapphire substrate.SOLUTION: A nitride semiconductor element manufacturing method comprises: a first etching step of dry etching a sapphire substrate by providing a mask on a surface of the sapphire substrate on a c-plane side to form a plurality of salients each having a circular bottom face; a second etching step of wet etching the sapphire substrate where the salients are formed to form the salients each having a triangular pyramid tip while maintaining the bottom face of the salient in a circular shape; and a semiconductor layer growth step of growing a semiconductor layer on the surface of the sapphire substrate on the side where the salients are formed.
申请公布号 JP2015211136(A) 申请公布日期 2015.11.24
申请号 JP20140091993 申请日期 2014.04.25
申请人 NICHIA CHEM IND LTD 发明人 SHIMOOKA TOMOSUKE
分类号 H01L21/205;C30B25/18;C30B29/38;H01L21/3065;H01L21/308;H01L33/22;H01L33/32 主分类号 H01L21/205
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