发明名称 Deflector, optical scanner, and scanning distance measuring equipment
摘要 Scanning distance measuring equipment includes a light emitter/receiver and a deflector for deflecting and reflecting measurement light emitted from the light emitter/receiver to outside through an optical window. The deflector is provided with a first deflection mechanism including a movable unit swingable about a first axis and a drive unit for driving to swing the movable unit; a second deflection mechanism for driving to rotate the first deflection mechanism about a second axis perpendicular to the first axis; and a contactless power supply unit including a second coil that is located to rotate about the second axis along with the rotating second deflection mechanism, and a first coil that is located to face the second coil on a common axis.
申请公布号 US9195060(B2) 申请公布日期 2015.11.24
申请号 US201313775927 申请日期 2013.02.25
申请人 HOKUYO AUTOMATIC CO., LTD. 发明人 Mori Toshihiro;Asada Norihiro;Takai Kazuo
分类号 H01J3/14;G02B26/10;G01S17/42;G01S7/481;G02B26/08 主分类号 H01J3/14
代理机构 Oliff PLC 代理人 Oliff PLC
主权项 1. A deflector comprising: a first deflection mechanism including a movable unit swingable about a first axis and a drive unit that swings the movable unit; a second deflection mechanism that rotates the first deflection mechanism about a second axis different from the first axis; a contactless power supply unit including a second coil that is electrically connected to the drive unit and is located to rotate about the second axis along with the rotating second deflection mechanism, and a first coil that is located to face the second coil on a common axis, the contactless power supply unit for supplying power from the first coil to the second coil in accordance with an electromagnetic induction system; a light emitter/receiver located on the second axis; a light deflecting unit provided at the movable unit, that deflects and reflects measurement light emitted from the light emitter/receiver along the second axis and guides, to the light emitter/receiver, light reflected by an object out of the measurement light thus deflected and reflected; a reference reflection member comprising regions of different reflectance along the second axis, and being irradiated with the measurement light emitted from the light emitter/receiver and deflected and reflected by the light deflecting unit; and a swing controller that includes an amplitude detector that detects swing amplitude by the first deflection mechanism in accordance with the reflected light from the reference reflection member and received by the light emitter/receiver, and an amplitude controller that controls the drive unit such that the swing amplitude detected by the amplitude detector has a predetermined value.
地址 Osaka JP