发明名称 DEVICE AND SYSTEM
摘要 PROBLEM TO BE SOLVED: To detect abnormality of a filter accurately.SOLUTION: A filter 113 is provided at the intake position of a rack 110 for housing a first electronic device 111. A first measurement section 121 measures the temperature of the first electronic device 111. A second measurement section 122 measures the temperature on the periphery of the first electronic device 111. A determining section 124 determines whether or not the surface temperature has exceeded a predetermined temperature dependent on the peripheral temperature, based on each temperature measured by the first measurement section 121 and second measurement section 122 when air is taken into the rack 110 from the intake position by means of a fan 114. When a determination is made that the surface temperature has exceeded a predetermined temperature in the determining section 124, an output section 125 outputs a signal indicating abnormality of the filter 113.
申请公布号 JP2015211088(A) 申请公布日期 2015.11.24
申请号 JP20140090707 申请日期 2014.04.24
申请人 FUJITSU LTD 发明人 SATO HIROYOSHI;SENBA TERUHIKO
分类号 H05K7/20;G06F1/00;G06F1/20 主分类号 H05K7/20
代理机构 代理人
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