发明名称 |
PARTICLE MEASURING APPARATUS |
摘要 |
PROBLEM TO BE SOLVED: To provide a particle measuring apparatus capable of precisely measuring grain size of fine particles.SOLUTION: A particle measuring apparatus 100 includes: a light projection element 111; a particle flow pass 33 for allowing the atmospheric air containing particles to flow therethrough; a light receiving element 112 that receives scattered light of light from the light projection element 111 which is scattered by the particles in the particle flow pass 33; a heating part 115 that heats a part of the atmospheric air with a current flowing thereon to generate an air flow in the particle flow pass 33; a temperature sensor 180 that measures the atmosphere temperature; a current adjustment section 170 that adjusts the current to flow on the heating part 115 based on the atmosphere temperature measured by the temperature sensor 180; a IV conversion section 121 that converts the voltage signal current output from the light receiving element 112; an amplifier 122 that amplifies the voltage signal and converts the same into a voltage signal which includes a pulse waveform corresponding to the particles; and a calculation unit 162 that calculates the grain size of the particles based on the voltage signal including the pulse waveform. |
申请公布号 |
JP2015210184(A) |
申请公布日期 |
2015.11.24 |
申请号 |
JP20140091852 |
申请日期 |
2014.04.25 |
申请人 |
PANASONIC IP MANAGEMENT CORP |
发明人 |
OKITA ATSUSHI;NOMURA KENTARO |
分类号 |
G01N15/02 |
主分类号 |
G01N15/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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