发明名称 PARTICLE MEASURING APPARATUS
摘要 PROBLEM TO BE SOLVED: To provide a particle measuring apparatus capable of precisely measuring grain size of fine particles.SOLUTION: A particle measuring apparatus 100 includes: a light projection element 111; a particle flow pass 33 for allowing the atmospheric air containing particles to flow therethrough; a light receiving element 112 that receives scattered light of light from the light projection element 111 which is scattered by the particles in the particle flow pass 33; a heating part 115 that heats a part of the atmospheric air with a current flowing thereon to generate an air flow in the particle flow pass 33; a temperature sensor 180 that measures the atmosphere temperature; a current adjustment section 170 that adjusts the current to flow on the heating part 115 based on the atmosphere temperature measured by the temperature sensor 180; a IV conversion section 121 that converts the voltage signal current output from the light receiving element 112; an amplifier 122 that amplifies the voltage signal and converts the same into a voltage signal which includes a pulse waveform corresponding to the particles; and a calculation unit 162 that calculates the grain size of the particles based on the voltage signal including the pulse waveform.
申请公布号 JP2015210184(A) 申请公布日期 2015.11.24
申请号 JP20140091852 申请日期 2014.04.25
申请人 PANASONIC IP MANAGEMENT CORP 发明人 OKITA ATSUSHI;NOMURA KENTARO
分类号 G01N15/02 主分类号 G01N15/02
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