发明名称 | Magnetic memory element and magnetic memory device | ||
摘要 | There is disclosed a memory element including a memory layer that has a magnetization and a magnetization direction thereof varies corresponding to information; a magnetization-fixed layer that has a magnetization; and an insulating layer that is provided between the memory layer and the magnetization-fixed layer, wherein an electron that is spin-polarized is injected in a lamination direction of a layered structure, and thereby the magnetization direction of the memory layer varies and a recording of information is performed with respect to the memory layer, and a Ta film in contact with a face of the magnetization-fixed layer, the face of the magnetization-fixed layer is opposite to the insulating layer side. | ||
申请公布号 | US9196333(B2) | 申请公布日期 | 2015.11.24 |
申请号 | US201414278716 | 申请日期 | 2014.05.15 |
申请人 | Sony Corporation | 发明人 | Uchida Hiroyuki;Hosomi Masanori;Ohmori Hiroyuki;Bessho Kazuhiro;Higo Yutaka;Yamane Kazutaka |
分类号 | G11C11/00;G11C11/16;H01F10/32;H01L43/08;H01L43/10;H01L27/22 | 主分类号 | G11C11/00 |
代理机构 | K&L Gates LLP | 代理人 | K&L Gates LLP |
主权项 | 1. A memory element, comprising: a memory layer configured to store an information associated with a magnetization state of a magnetic material; a magnetization-fixed layer that has a magnetization serving as a reference of the information stored in the memory layer; and an insulating layer that is provided between the memory layer and the magnetization-fixed layer and is formed of a non-magnetic material, wherein a spin-polarized electron is injected in a lamination direction of a layered structure having the memory layer, the insulating layer, and the magnetization-fixed layer, and thereby the magnetization direction of the memory layer varies and a recording of information is performed with respect to the memory layer, and a Ta film in contact with a face of the magnetization-fixed layer, the face of the magnetization-fixed layer is opposite to the insulating layer side, wherein the magnetic material includes Co, Fe, and B, and the composition ratio of Co, Fe and B satisfy the following equation; (Cox—Fey)100-z—Bz, wherein 0≦Cox≦40, 60≦Fey≦100, 0<Bz≦30. | ||
地址 | Tokyo JP |