| 发明名称 | Method and device for the detection of surface defects of a component | ||
| 摘要 | A method serves the detection of surface defects of a component. The surface of the component (5) is radiated from the side with light from a light source (4, 4′). The light radiated back from the surface of the component (5) is detected by a sensor. To improve such a method, only a rear region (19, 19′) of the surface of the component (5) is radiated with light from the light source (4, 4′) and/or only the light radiated back from a rear region (19, 19′) of the surface of the component (5) is detected by the sensor and/or evaluated by an evaluation device FIG. 3). | ||
| 申请公布号 | US9194810(B2) | 申请公布日期 | 2015.11.24 |
| 申请号 | US200812228061 | 申请日期 | 2008.08.08 |
| 申请人 | Steinbichler Optotechnik GmbH | 发明人 | Schleith Christian;Winterberg Horst;Steinbichler Marcus |
| 分类号 | G01N21/00;G01N21/88 | 主分类号 | G01N21/00 |
| 代理机构 | Dilworth & Barrese, LLP. | 代理人 | Dilworth & Barrese, LLP. |
| 主权项 | 1. A method for the detection of surface defects of a component (5), wherein the surface of the component (5) is radiated from the side with light from a light source (4, 4′); the light radiated back from the surface of the component (5) is detected by a sensor; only a rear region (19, 19′) of the surface of the component (5) is radiated with light from the light source (4, 4′); and/or in that only the light radiated back from a rear region (19, 19′) of the surface of the component (5) is detected by the sensor and/or is evaluated by an evaluation device, wherein the light source and the sensor are arranged such that in the absence of surface defects no light enters into the sensor by the reflection on the surface of the component. | ||
| 地址 | Neubeuern DE | ||