发明名称 PARTICLE MEASURING APPARATUS
摘要 PROBLEM TO BE SOLVED: To provide a particle measuring apparatus capable of precisely measuring grain size of fine particles.SOLUTION: A particle measuring apparatus 100 is an apparatus for measuring particles, which includes: a light projection element 111; a light receiving element 112; and a particle detection sensor 110 that detects particles contained in the atmospheric air by receiving scattered light of light from the light projection element 111 which are scattered by the particles in a detection area DA with the light receiving element 112. The particle measuring apparatus 100 also includes: a IV conversion section 121 that generates a voltage signal by converting a current output from the light receiving element 112 into a voltage; an amplifier 122 that amplifies a voltage signal in a predetermined bandwidth; and an AD conversion section 161 that performs sampling and quantizes the voltage signal amplified by the amplifier 122.
申请公布号 JP2015210183(A) 申请公布日期 2015.11.24
申请号 JP20140091845 申请日期 2014.04.25
申请人 PANASONIC IP MANAGEMENT CORP 发明人 OKITA ATSUSHI;NOMURA KENTARO
分类号 G01N15/02 主分类号 G01N15/02
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