| 摘要 |
<p><P>PROBLEM TO BE SOLVED: To accurately detect abnormality to such a detection level of circumferential location when a charging potential of a photoreceptor varies, for determining whether the abnormality occurs in a photoreceptor side or in a measuring device side. <P>SOLUTION: A characteristic evaluation apparatus 20 for evaluating characteristics of a photoreceptor 1 as an object of characteristics evaluation includes, in a periphery of the photoreceptor 1, at least a charging device 6, an exposing device, first and second surface potentiometer probes, a displacement sensor 11 and a motor 13 that controls a rotation amount of the photoreceptor 1. The evaluation apparatus further includes: first calculating means 22, which calculates a predicted change amount of the charging potential in accordance with a deflection amount; second calculating means 23, which measures a deflection amount of the photoreceptor 1 at a plurality of different positions in a circumferential direction with the displacement sensor 11 while controlling rotation of the photoreceptor 1, and which calculates a predicted charging potential based on the predicted change amount of the charging potential for the measured deflection amount at each measured position and based on the charging potential obtained when characteristics of the photoreceptor 1 are measured; and abnormality detecting means 24, which detects abnormality of the photoreceptor based on the predicted charging potential. <P>COPYRIGHT: (C)2013,JPO&INPIT</p> |
