| 摘要 |
PROBLEM TO BE SOLVED: To provide a selection system capable of combining a pair of best sensor base materials, and a manufacturing apparatus and an inspection apparatus of a touch panel sensor in the touch panel sensor where a pair of sensor lines is overlapped while crossing orthogonally mutually by using the sensor base material made of a plurality of sensor lines that are made of a conductive material and are formed at an equal interval in a line.SOLUTION: A sensor base material 10 is captured, information on a position and size of a sensor line 2 is converted to a map from the obtained information, the presence or absence of defects is determined based on defect regulations, the sensor base materials 10 that have a defect which is not fatal are overlapped to positions orthogonal to mutual sensor lines A as a pair, and a combination of the pair of sensor base materials 10 is selected based on pass/fail determination of an entire grid area 17. |
