发明名称 Stress release layout and associated methods and devices
摘要 An embodiment semiconductor device includes a substrate such as a silicon or silicon-containing film, a pixel array supported by the substrate, and a metal stress release feature arranged around a periphery of the pixel array. The metal stress release feature may be formed from metal strips or discrete metal elements. The metal stress release feature may be arranged in a stress release pattern that uses a single line or a plurality of lines. The metal stress release pattern may also use metal corner elements at ends of the lines.
申请公布号 US9196642(B2) 申请公布日期 2015.11.24
申请号 US201213708625 申请日期 2012.12.07
申请人 Taiwan Semiconductor Manufacturing Company, Ltd. 发明人 Tsai Tsung-Han;Tseng Allen;Ho Yen-Hsung;Chou Chun-Hao;Lee Kuo-Cheng;Chien Volume;Jeng Chi-Cherng
分类号 H01L27/146;H01L21/00;H01L31/18 主分类号 H01L27/146
代理机构 Slater & Matsil, L.L.P. 代理人 Slater & Matsil, L.L.P.
主权项 1. A semiconductor device, comprising: a semiconductor substrate; a pixel array disposed within the semiconductor substrate; one or more metal stress release features on the semiconductor substrate and arranged around a periphery of the pixel array, the one or more stress release features comprising at least one continuous strip parallel to a side of the pixel array; and an interlayer dielectric layer over the pixel array and the one or more metal stress release features, the interlayer dielectric layer being a lowermost interlayer dielectric layer.
地址 Hsin-Chu TW