发明名称 METHOD TO MEASURE SPECIFIC SURFACE OF MATERIALS
摘要 FIELD: measurement equipment.SUBSTANCE: previously before sorption a chamber with a source connected to a chamber with investigated material is blown with inert gas and vacuumised. Further to ensure sorption, temperature of the chamber with the source is maintained at the level of 500÷550°C, temperature of the chamber with the investigated material is maintained by 20÷30°C higher than temperature of the chamber with the source. Then both chambers are repeatedly blown with inert gas and vacuumised. And then desorption of silver is carried out by selective dissolvent at room temperature with subsequent analysis of silver quantity in the solution by spectral method. At the same time, for instance, as a selective dissolvent they may use single-molar nitric acid. And the spectral method is method of inductively coupled plasma. The sorption process is carried out for 15-30 minutes.EFFECT: increased accuracy of specific surface measurement in dispersed, porous and compact materials with simultaneous range expansion.4 cl, 3 dwg
申请公布号 RU2569347(C1) 申请公布日期 2015.11.20
申请号 RU20140124412 申请日期 2014.06.17
申请人 FEDERAL'NOE GOSUDARSTVENNOE UNITARNOE PREDPRIJATIE "NAUCHNO-ISSLEDOVATEL'SKIJ INSTITUT NAUCHNO-PROIZVODSTVENNOE OB"EDINENIE "LUCH" (FGUP "NII NPO "LUCH") 发明人 ISAKOV VIKTOR PAVLOVICH;GALEV IVAN EHDUARDOVICH;LJUBEZNOVA ELENA NIKOLAEVNA;FEDOROV EVGENIJ NIKOLAEVICH
分类号 G01N15/08;G01N30/00 主分类号 G01N15/08
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