发明名称 LASER ANNEALING APPARATUS AND LASER ANNEALING METHOD
摘要 The present invention provides an efficient heat treatment such as activation treatment of impurities on a substrate such as a thick silicon wafer with large heat capacity by laser annealing.;Provided is a laser annealing apparatus 1 for heat-treating a surface of a substrate 30 comprising: a pulse oscillation laser source 10 which generates a pulse laser with gentle rise time and long pulse width; a continuous wave laser source 20 which generates a near-infrared laser for assisting annealing; optical systems 12, 22 which shape and guide beams 15, 25 of the two types of lasers respectively so as to irradiate the surface of the substrate 30 therewith; and a moving device 3 which moves the substrate 30 relatively to the laser beams 15, 25 to allow scanning of the combined irradiation of the two types of laser beams. According to this apparatus, deep activation of impurities can be performed in a thick semiconductor substrate with large heat capacity while securing sufficient light penetration depth and thermal diffusion length therefor.
申请公布号 US2015332923(A1) 申请公布日期 2015.11.19
申请号 US201514725129 申请日期 2015.05.29
申请人 THE JAPAN STEEL WORKS, LTD. 发明人 KUDO Toshio;KOBAYASHI Naoyuki;SANO Kazuya;SEINO Toshiaki;TOYODA Mitsuhiro
分类号 H01L21/268;H01L29/66;H01L21/324;H01L21/263 主分类号 H01L21/268
代理机构 代理人
主权项
地址 Tokyo JP