发明名称 NITRIDE SEMICONDUCTOR SUBSTRATE, NITRIDE SEMICONDUCTOR DEVICE, NITRIDE SEMICONDUCTOR SUBSTRATE MANUFACTURING METHOD AND NITRIDE SEMICONDUCTOR DEVICE MANUFACTURING METHOD
摘要 PROBLEM TO BE SOLVED: To achieve on an independent substrate composed of a nitride semiconductor, a nitride semiconductor substrate on which a nitride semiconductor layer which contains a C atom as an impurity and has favorable crystallinity is generated.SOLUTION: A nitride semiconductor substrate manufacturing method comprises: a process of preparing a base substrate 10; and a process of forming on the base substrate, a carbon-containing nitride semiconductor layer which contains carbon contained in an organic metal to be a material of a nitride semiconductor and has a half maximum full-width (FWHM) of an X-ray rocking curve of a (0002) plane is equal to or less than 55 arcsec by growing the nitride semiconductor under an optimized growth condition.
申请公布号 JP2015207618(A) 申请公布日期 2015.11.19
申请号 JP20140086189 申请日期 2014.04.18
申请人 FURUKAWA CO LTD 发明人 SUMIDA YUKITSUNE;TSURUOKA SEIKI
分类号 H01L21/205;C30B25/16;C30B29/38 主分类号 H01L21/205
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