发明名称 |
NITRIDE SEMICONDUCTOR SUBSTRATE, NITRIDE SEMICONDUCTOR DEVICE, NITRIDE SEMICONDUCTOR SUBSTRATE MANUFACTURING METHOD AND NITRIDE SEMICONDUCTOR DEVICE MANUFACTURING METHOD |
摘要 |
PROBLEM TO BE SOLVED: To achieve on an independent substrate composed of a nitride semiconductor, a nitride semiconductor substrate on which a nitride semiconductor layer which contains a C atom as an impurity and has favorable crystallinity is generated.SOLUTION: A nitride semiconductor substrate manufacturing method comprises: a process of preparing a base substrate 10; and a process of forming on the base substrate, a carbon-containing nitride semiconductor layer which contains carbon contained in an organic metal to be a material of a nitride semiconductor and has a half maximum full-width (FWHM) of an X-ray rocking curve of a (0002) plane is equal to or less than 55 arcsec by growing the nitride semiconductor under an optimized growth condition. |
申请公布号 |
JP2015207618(A) |
申请公布日期 |
2015.11.19 |
申请号 |
JP20140086189 |
申请日期 |
2014.04.18 |
申请人 |
FURUKAWA CO LTD |
发明人 |
SUMIDA YUKITSUNE;TSURUOKA SEIKI |
分类号 |
H01L21/205;C30B25/16;C30B29/38 |
主分类号 |
H01L21/205 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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