| 摘要 |
PROBLEM TO BE SOLVED: To provide a sample placement device used for a special microscope using a portable communication terminal.SOLUTION: A magnet friction type sample plate position control device includes: a sample plate 1 formed by a transparent synthetic resin sample placement member 11 including an acrylate resin made from a strip-like shape; a support member 2 provided on the lower side of the sample plate 1 so as to support the sample plate 1 and formed to have a moderate magnetic force; a Leeuwenhoek microscope 3 provided on a lower side of the support member 2 and mainly forming a ball lens 31; and a portable communication terminal 5 provided on the lower side of the Leeuwenhoek microscope 3 and installed so that a camera lens 51 is aligned with an optical axis of the ball lens 31 of the Leeuwenhoek microscope 3. The support member 2 is set with a height (thick) 21 high in height and a height 22 low in height (thin), and these heights are mounted on the upper side of the Leeuwenhoek microscope 3. |
