发明名称 METHOD FOR FABRICATING A SEMI-FLOATING GATE TRANSISTOR
摘要 A semi-floating gate transistor structure includes a substrate, a first N-well region and a second N-well region separated from each other in the substrate, and a gate oxide layer on the substrate. The gate oxide layer includes a separation groove disposed on the first N-well region. The semi-floating gate transistor structure further includes a P-type doped floating gate having a first portion filling the separation groove and a second portion integrally formed on the first portion. The first portion of the P-type doped floating gate and the first N-well region form a pn-junction diode.
申请公布号 US2015333079(A1) 申请公布日期 2015.11.19
申请号 US201514631838 申请日期 2015.02.25
申请人 SEMICONDUCTOR MANUFACTURING INTERNATIONAL (SHANGHAI) CORPORATION 发明人 PENG KUN
分类号 H01L27/115;H01L21/28;H01L29/66;H01L27/105;H01L29/423 主分类号 H01L27/115
代理机构 代理人
主权项
地址 Shanghai CN