发明名称 SUBSTRATE TREATMENT DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a substrate treatment device that can accurately detect a metal film remaining as residue at a surface to be polished of a post-polished substrate.SOLUTION: The substrate treatment device includes: a polishing part 3 for removing the metal film formed at the surface to be polished after polishing the surface to be polished of the substrate; a cleaning part 4 for cleaning and drying the substrate polished by the polishing part 3; and a temporarily placing table 180 on which the substrate is temporarily placed after being polished by the polishing part 3. The temporarily placing table 180 is provided with sensors 8, 9 for detecting the metal film remaining at the surface to be polished of the substrate.
申请公布号 JP2015205359(A) 申请公布日期 2015.11.19
申请号 JP20140086177 申请日期 2014.04.18
申请人 EBARA CORP 发明人 MARUYAMA KOJI
分类号 B24B49/02;B24B37/34;B24B49/10;B24B49/12;H01L21/304;H01L21/66 主分类号 B24B49/02
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