发明名称 |
MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE |
摘要 |
PROBLEM TO BE SOLVED: To provide a transistor using an oxide semiconductor having high ion characteristics; and to provide a highly functional semiconductor device having a transistor capable of high-speed response and high-speed drive.SOLUTION: In a transistor having an oxide semiconductor, by introducing (adding) oxygen-vacancy-inducing factors to an oxide semiconductor layer, a source region and a drain region are selectively made to have low resistance. By introducing the oxygen-vacancy-inducing factors to the oxide semiconductor layer, an oxygen defect which functions as a donor can be effectively formed in the oxide semiconductor layer. It is preferable to introduce the oxygen-vacancy-inducing factors to be introduced by an ion implantation method using one or more metal elements selected from among titanium, tungsten and molybdenum. |
申请公布号 |
JP2015207788(A) |
申请公布日期 |
2015.11.19 |
申请号 |
JP20150140192 |
申请日期 |
2015.07.14 |
申请人 |
SEMICONDUCTOR ENERGY LAB CO LTD |
发明人 |
YAMAZAKI SHUNPEI;HIZUKA JUNICHI |
分类号 |
H01L21/336;G02F1/1368;H01L29/786 |
主分类号 |
H01L21/336 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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