发明名称 MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a transistor using an oxide semiconductor having high ion characteristics; and to provide a highly functional semiconductor device having a transistor capable of high-speed response and high-speed drive.SOLUTION: In a transistor having an oxide semiconductor, by introducing (adding) oxygen-vacancy-inducing factors to an oxide semiconductor layer, a source region and a drain region are selectively made to have low resistance. By introducing the oxygen-vacancy-inducing factors to the oxide semiconductor layer, an oxygen defect which functions as a donor can be effectively formed in the oxide semiconductor layer. It is preferable to introduce the oxygen-vacancy-inducing factors to be introduced by an ion implantation method using one or more metal elements selected from among titanium, tungsten and molybdenum.
申请公布号 JP2015207788(A) 申请公布日期 2015.11.19
申请号 JP20150140192 申请日期 2015.07.14
申请人 SEMICONDUCTOR ENERGY LAB CO LTD 发明人 YAMAZAKI SHUNPEI;HIZUKA JUNICHI
分类号 H01L21/336;G02F1/1368;H01L29/786 主分类号 H01L21/336
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