发明名称 MEASUREMENT DEVICE
摘要 A measurement device includes a stage for carrying an object to be measured, an insulating board having a through hole, a probe fixed on the undersurface of the insulating board, a side wall section in a shape surrounding the probe, a pressurizing section provided on the top surface of the insulating board, the pressuring section supplying a gas below the insulating board via the through hole, and a measurement section electrically connected to the probe to control the pressurizing section, wherein the measurement section measures an electric property of the object to be measured via the probe in a state where the pressurizing section is controlled to supply a gas to a measurement space located below the insulating board to increase a pressure in the measurement space, the measurement space surrounded by the stage, the side wall section, and the insulating board.
申请公布号 US2015331011(A1) 申请公布日期 2015.11.19
申请号 US201514612892 申请日期 2015.02.03
申请人 Mitsubishi Electric Corporation 发明人 NOGUCHI Takaya;OKADA Akira;TAKESAKO Norihiro
分类号 G01R1/04;G01R1/067 主分类号 G01R1/04
代理机构 代理人
主权项 1. A measurement device, comprising: a stage for carrying an object to be measured; an insulating board having a through hole; a probe fixed on the undersurface of said insulating board; a side wall section in a shape surrounding said probe; a pressurizing section provided on the top surface of said insulating board, the pressuring section supplying a gas below said insulating board via said through hole; and a measurement section electrically connected to said probe to control said pressurizing section, wherein: said measurement section measures an electric property of said object to be measured via said probe in a state where said pressurizing section is controlled to supply a gas to a measurement space located below said insulating board to increase a pressure in said measurement space, the measurement space surrounded by said stage, said side wall section, and said insulating board.
地址 Tokyo JP