发明名称 X線装置、X線装置の制御装置、画像形成方法、構造物の製造方法、及び構造物製造システム
摘要 PROBLEM TO BE SOLVED: To suppress a reduction in the accuracy of examination.SOLUTION: An X-ray apparatus includes an X-ray source that emits X-rays, a detection device that detects at least a part of the X-rays emitted from the X-ray source and passed through a measuring object, and a control device that forms a third projection image by using a first projection image obtained from the measuring object with a first X-ray irradiation condition and a second projection image obtained from the measuring object with a second X-ray irradiation condition different from the first X-ray condition.
申请公布号 JP2015206685(A) 申请公布日期 2015.11.19
申请号 JP20140087496 申请日期 2014.04.21
申请人 发明人
分类号 G01N23/04 主分类号 G01N23/04
代理机构 代理人
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