发明名称 ZENER DIODE DEVICES AND RELATED FABRICATION METHODS
摘要 Zener diode structures and related fabrication methods and semiconductor devices are provided. An exemplary semiconductor device includes first and second Zener diode structures. The first Zener diode structure includes a first region, a second region that is adjacent to the first region, and a third region adjacent to the first region and the second region to provide a junction that is configured to influence a first reverse breakdown voltage of a junction between the first region and the second region. The second Zener diode structure includes a fourth region, a fifth region that is adjacent to the fourth region, and a sixth region adjacent to the fourth region and the fifth region to provide a junction configured to influence a second reverse breakdown voltage of a junction between the fourth region and the fifth region, wherein the second reverse breakdown voltage and the first reverse breakdown voltage are different.
申请公布号 US2015333189(A1) 申请公布日期 2015.11.19
申请号 US201514810140 申请日期 2015.07.27
申请人 FREESCALE SEMICONDUCTOR INC. 发明人 CHEN Weize;LIN XIin;PARRIS Patrice M.
分类号 H01L29/866;H01L29/06;H01L29/66 主分类号 H01L29/866
代理机构 代理人
主权项 1. A diode comprising: a first region having a first conductivity type; a second region having a second conductivity type, the first region overlying the second region and the second region being adjacent to the first region to provide a vertical junction between the first region and the second region; and a third region adjacent to the first region and the second region to provide a lateral junction between the third region and one of the first region or the second region, wherein: the lateral junction influences a first reverse breakdown voltage of the vertical junction; anda second reverse breakdown voltage of the lateral junction is greater than the first reverse breakdown voltage of the vertical junction.
地址 Austin TX US