发明名称 |
METHOD FOR ETCHING ETCHING TARGET LAYER |
摘要 |
Disclosed is an etching method for etching an etching target layer. The etching method includes: a first step of depositing a plasma reaction product on a mask layer made of an organic film formed on the etching target layer; and after the first step, a second step of etching the etching target layer. The mask layer includes a coarse region in which a plurality of openings are formed, and a dense region surrounding the coarse region. The mask layer exists more densely in the dense region than in the coarse region. The coarse region includes a first region and a second region positioned close to the dense region compared to the first region. In the second step of the etching method, a width of the openings in the first region becomes narrower than a width of the openings in the second region. |
申请公布号 |
US2015332932(A1) |
申请公布日期 |
2015.11.19 |
申请号 |
US201514709534 |
申请日期 |
2015.05.12 |
申请人 |
TOKYO ELECTRON LIMITED |
发明人 |
HIROTSU Shin;IGARASHI Yoshiki;MIWA Tomonori;OKADA Hiroshi |
分类号 |
H01L21/311 |
主分类号 |
H01L21/311 |
代理机构 |
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代理人 |
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主权项 |
1. An etching method for etching an etching target layer, the etching method comprising:
depositing a plasma reaction product on a mask layer made of an organic film formed on the etching target layer; and etching the etching target layer after the depositing the plasma reaction product, wherein the mask layer includes a coarse region in which a plurality of openings are formed, and a dense region surrounding the coarse region, the mask layer existing more densely in the dense region than in the coarse region, the coarse region includes a first region and a second region positioned close to the dense region compared to the first region, and in the depositing the plasma reaction product, a width of the openings in the first region becomes narrower than a width of the openings in the second region. |
地址 |
Tokyo JP |