发明名称 SEMICONDUCTOR STRUCTRURE WITH COMPOSITE BARRIER LAYER UNDER REDISTRIBUTION LAYER AND MANUFACTURING METHOD THEREOF
摘要 A mechanism of a semiconductor structure with composite barrier layer under redistribution layer is provided. A semiconductor structure includes a substrate comprising a top metal layer on the substrate; a passivation layer over the top metal layer having an opening therein exposing the top metal layer; a composite barrier layer over the passivation layer and the opening, the composite barrier layer includes a center layer, a bottom layer, and an upper layer, wherein the bottom layer and the upper layer sandwich the center layer; and a redistribution layer (RDL) over the composite barrier layer and electrically connecting the underlying top metal layer.
申请公布号 US2015333021(A1) 申请公布日期 2015.11.19
申请号 US201414278729 申请日期 2014.05.15
申请人 Taiwan Semiconductor Manufacturing Co., Ltd. 发明人 WU Chun-Yu;SHANG Yu-Wei;KANG An-Chi
分类号 H01L23/00;H01L23/498 主分类号 H01L23/00
代理机构 代理人
主权项 1. A semiconductor structure, comprising: a substrate comprising a top metal layer on the substrate; a passivation layer over the top metal layer having an opening therein exposing the top metal layer; a composite barrier layer over the passivation layer and the opening, the composite barrier layer comprising: a bottom layer over the passivation layer and the openinga center layer over the bottom layer; andan upper layer over the center layer; and a redistribution layer (RDL) over the composite barrier layer and electrically connecting the underlying top metal layer.
地址 Hsinchu TW