发明名称 |
SEMICONDUCTOR STRUCTRURE WITH COMPOSITE BARRIER LAYER UNDER REDISTRIBUTION LAYER AND MANUFACTURING METHOD THEREOF |
摘要 |
A mechanism of a semiconductor structure with composite barrier layer under redistribution layer is provided. A semiconductor structure includes a substrate comprising a top metal layer on the substrate; a passivation layer over the top metal layer having an opening therein exposing the top metal layer; a composite barrier layer over the passivation layer and the opening, the composite barrier layer includes a center layer, a bottom layer, and an upper layer, wherein the bottom layer and the upper layer sandwich the center layer; and a redistribution layer (RDL) over the composite barrier layer and electrically connecting the underlying top metal layer. |
申请公布号 |
US2015333021(A1) |
申请公布日期 |
2015.11.19 |
申请号 |
US201414278729 |
申请日期 |
2014.05.15 |
申请人 |
Taiwan Semiconductor Manufacturing Co., Ltd. |
发明人 |
WU Chun-Yu;SHANG Yu-Wei;KANG An-Chi |
分类号 |
H01L23/00;H01L23/498 |
主分类号 |
H01L23/00 |
代理机构 |
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代理人 |
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主权项 |
1. A semiconductor structure, comprising:
a substrate comprising a top metal layer on the substrate; a passivation layer over the top metal layer having an opening therein exposing the top metal layer; a composite barrier layer over the passivation layer and the opening, the composite barrier layer comprising:
a bottom layer over the passivation layer and the openinga center layer over the bottom layer; andan upper layer over the center layer; and a redistribution layer (RDL) over the composite barrier layer and electrically connecting the underlying top metal layer. |
地址 |
Hsinchu TW |